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High-Speed High-Resolution Subsurface Defect Detection in Ceramics Using Optical Gating Techniques

机译:利用光学选通技术对陶瓷进行高速高分辨率亚表面缺陷检测

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摘要

Optical gating techniques and in particular optical coherence tomography (OCT) have recently been used as a noninvasive probe in the medical field[l,2] and as a nondestructive probe in material analysis[3–5]. Indeed, any medium which has some light penetration below the surface can potentially be analyzed with OCT. The depth at which a signal can be detected depends both on light absorption and scattering, with the second playing a more critical role in most materials of interest. In this work we concentrate on the application of OCT towards defect detection in ceramic materials. For the various ceramics that we have analyzed in the laboratory, the maximum penetration depths ranged from a few tens of microns to approximately one millimeter below the surface. Because of this limited penetration depth, OCT can not be applied to detect defects buried deep below the surface in ceramic materials. However, because operational stresses of many ceramic components are greatest in the near-surface region, the defects at or just below the surface are the most important to detect.
机译:光学门控技术,特别是光学相干断层扫描(OCT),最近在医学领域已被用作非侵入性探针[1,2],在材料分析中已被用作非破坏性探针[3-5]。确实,可以使用OCT分析在表面以下具有一定透光率的任何介质。可以检测到信号的深度取决于光的吸收和散射,第二种在大多数感兴趣的材料中起着更为关键的作用。在这项工作中,我们专注于OCT在陶瓷材料缺陷检测中的应用。对于我们在实验室中分析过的各种陶瓷,最大穿透深度范围从表面以下的几十微米到大约一毫米。由于这种有限的穿透深度,OCT不能用于检测埋在陶瓷材料表面深处的缺陷。但是,由于许多陶瓷组件的工作应力在近表面区域最大,因此检测表面或表面以下的缺陷最为重要。

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